Detailansicht
Low-Frequency Noise in Advanced MOS Devices
Analog Circuits and Signal Processing
ISBN/EAN: 9781402059094
Umbreit-Nr.: 1389246
Sprache:
Englisch
Umfang: xvi, 216 S.
Format in cm:
Einband:
gebundenes Buch
Erschienen am 24.07.2007
Auflage: 1/2007
- Zusatztext
- InhaltsangabeAuthors. Preface. Acknowledgments. Chapter 1 Fundamental noise mechanisms. Introduction. Basic noise theory. Fundamental noise sources. Noise circuit analysis. Chapter 2 Noise characterization. Introduction. Low-frequency noise measurements. Noise as a diagnostic tool. Chapter 3 1/f noise in MOSFETs - origins and modelling. Introduction. MOSFET noise model. Number fluctuations, Mobility fluctuations. Impact of substrate voltage. Compact noise models. Input referred noise. Chapter 4 1/f Noise performance of advanced CMOS devices. Introduction. 1/f noise performance overview. 1/f noise performance of ultra-scaled devices. SiGe channel pMOSFETs. Strained Si devices. Silicon-on-insulator devices. MOSFETs with high-k gate dielectrics. Metal gate devices. Multiple gate devices. Chapter 5 Introduction to noise in RF/analog circuits. Introduction. Upconversion of noise. Voltage controlled oscillator (VCO). Mixer. Low-Noise Amplifier (LNA). Appendix I List of Symbols. Appendix II List of Acronyms. Appendix III Solutions to problems. Index.
- Kurztext
- Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.
- Autorenportrait
- InhaltsangabeAuthors. Preface. Acknowledgments. Chapter 1 Fundamental noise mechanisms. Introduction. Basic noise theory. Fundamental noise sources. Noise circuit analysis. Chapter 2 Noise characterization. Introduction. Low-frequency noise measurements. Noise as a diagnostic tool. Chapter 3 1/f noise in MOSFETs - origins and modelling. Introduction. MOSFET noise model. Number fluctuations, Mobility fluctuations. Impact of substrate voltage. Compact noise models. Input referred noise. Chapter 4 1/f Noise performance of advanced CMOS devices. Introduction. 1/f noise performance overview. 1/f noise performance of ultra-scaled devices. SiGe channel pMOSFETs. Strained Si devices. Silicon-on-insulator devices. MOSFETs with high-k gate dielectrics. Metal gate devices. Multiple gate devices. Chapter 5 Introduction to noise in RF/analog circuits. Introduction. Upconversion of noise. Voltage controlled oscillator (VCO). Mixer. Low-Noise Amplifier (LNA). Appendix I List of Symbols. Appendix II List of Acronyms. Appendix III Solutions to problems. Index.