Detailansicht
Scanning Electron Microscopy and X-Ray Microanalysis
Third Edition
Goldstein, Joseph/Newbury, Dale E/Joy, David C et al
ISBN/EAN: 9780306472923
Umbreit-Nr.: 1664474
Sprache:
Englisch
Umfang: xix, 689 S.
Format in cm: 5 x 26 x 18.5
Einband:
gebundenes Buch
Erschienen am 31.01.2003
Auflage: 3/2007
- Kurztext
- The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globeThe authors have made extensive changes to the text and figures in this edition as a result of their experience in teaching the various concepts of SEM and x-ray microanalysis