Detailansicht
Quantum Metrology, Imaging, and Communication
Quantum Science and Technology
ISBN/EAN: 9783319835402
Umbreit-Nr.: 5447844
Sprache:
Englisch
Umfang: xii, 273 S., 37 s/w Illustr., 68 farbige Illustr.,
Format in cm:
Einband:
kartoniertes Buch
Erschienen am 04.07.2018
Auflage: 1/2017
- Kurztext
- This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
- Autorenportrait
- David Simon. Professor, Stonehill College, Easton MA 02357, USA Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA Alexander V. Sergienko, Boston University, Boston MA 02215, USA