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Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials, Springer Series in Advanced Microelectronics 10
ISBN/EAN: 9783319998244
Umbreit-Nr.: 5373974
Sprache:
Englisch
Umfang: xxi, 321 S., 58 s/w Illustr., 68 farbige Illustr.,
Format in cm: 2.5 x 24 x 16
Einband:
gebundenes Buch
Erschienen am 22.01.2019
Auflage: 3/2018
- Kurztext
- This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.